Emma Chou is a DFT Engineer at 聯發科, where they focus on N4/N4P/N3E Scan volume diagnosis analysis and silicon debugging. They utilize tools such as TMAX, Tessent, and YieldExplorer, and are skilled in automating diagnosis flows and ATE fail log processing. Previously, Emma served as a Test Development Engineer at 高通, optimizing testing processes for PMIC devices, and as a Test Engineer at 瑞昱半導體股份有限公司, where they constructed ATE programs and collaborated for problem-solving. Emma holds a Master's degree in Optoelectronic Engineering from 國立交通大學.
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