Dat Tran

Dat Tran is a highly experienced engineer with a focus on semiconductor technology, particularly in 3D NAND flash memory. Currently serving as Principal Engineer at Micron Technology since January 2019, Dat Tran works on the 3D NAND program and UFS 4.0 interface. Previously, Dat Tran held the position of Staff Test Development Engineer at SanDisk from September 2013 to December 2018, where contributions included the development of the first 3D NAND flash memory BiCS2 and final test programs for MLC and TLC devices. Additional experience includes roles as Technologist Test Development Engineer at Western Digital, Sr. Test Engineer at Spansion, and Test Engineering Lead at Pericom Semiconductor. Dat Tran began a career in testing and program development for flash memory devices at VLSI Technologies, Inc. Dat Tran holds a Bachelor’s degree and a Master's degree in Electrical and Electronics Engineering from the University of California, Davis, and San Jose State University, respectively.