John Stout

John Stout is a Technology Pathfinding Engineer at Micron Technology since August 2018, where responsibilities include implementing probe and bench characterization tests for emerging memories and communicating experimental results to design, modeling, and process integration groups. Prior experience includes serving as a Reliability Engineer at Micron Technology, where metrics were reported to improve material reliability, and as a Research Assistant at Brigham Young University, focusing on the design and fabrication of novel MEMS devices and microfabrication processes. Earlier in the career, John Stout worked as a PCB group technician at Nano Integrated Solutions, developing a database to enhance productivity and facilitating communication between customers and design teams. Stout holds a PhD in Electrical and Electronics Engineering and a Bachelor of Science in the same field, both from Brigham Young University.