Josh Frederick is a Metrology Engineer at Micron Technology, where employment began in March 2017. Prior to this role, Josh served as a PhD Research Assistant at the University of Wisconsin-Madison from September 2010 to February 2017, focusing on mechanical constraints and compositional variations in sputter-deposited epitaxial thin films for novel applications. An internship at 3M in mid-2015 involved exploring advanced materials for electromagnetic interference absorbers. Josh also gained valuable research experience as a Graduate Research Assistant at Iowa State University while earning a Master's degree, and as an Undergraduate Research Assistant at Ames Laboratory in condensed matter physics. Educational qualifications include a Ph.D. in Materials Science from the University of Wisconsin-Madison and an M.S. in Materials Science and Engineering from Iowa State University.
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