Tim Hollis is a Fellow in Interface Pathfinding at Micron Technology, specializing in high-speed I/O design and signal and power integrity modeling. They previously held several key roles at Micron, including Distinguished Member of the Technical Staff and Senior Member of the Technical Staff in DRAM R&D. Tim's experience also includes technical internships at Intel and Micron, as well as teaching positions at ITT Technical Institute and Brigham Young University. They earned a Bachelor of Science in Electrical Engineering from the University of Utah and a Ph.D. in Electrical Engineering from Brigham Young University.
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