Gene Liu

MSS USA CORP, established in May 2024, is a subsidiary of MSSCORPS CO., LTD. We uphold our parent company’s tradition of delivering precise and prompt analytic services with exceptional quality to clients in the semiconductor industry, positioning ourselves as the premier R&D partner in this sector. Our core service is Transmission Electron Microscopy (TEM) analysis, which provides comprehensive structural (TEM/STEM imaging modes), chemical (EDS), and dimensional (auto CD measurements) information on materials of interest. Leveraging our proprietary and patented sample protection strategy, along with advanced FIB sample preparation techniques, we offer accurate TEM analysis for both hard and fragile materials used in cutting-edge technology developments, such as low-k dielectrics and EUV photoresists. This specialized analytic method furnishes R&D engineers with crucial insights, accelerating their development processes. We recognize that the protection of proprietary information (PIP) is of utmost importance. MSS USA adheres to the same rigorous PIP control procedures as its parent company, which has earned the trust and recognition of numerous world-renowned semiconductor companies. Every piece of information, including provided materials, samples, data, and analytic history, is meticulously recorded, securely stored, and robustly protected. MSS USA remains a trusted R&D metrology partner for companies that prioritize the safeguarding of their proprietary information. By expanding into the US market, we bring our expertise closer to our clients, enhancing collaboration and fostering innovation across the semiconductor industry.