Thomas Goislard de Monsabert

Thomas Goislard de Monsabert has worked in a variety of roles in the engineering field since 2000. In 2000, they were a Junior Engineer for Siemens Automotive S.A. in Toulouse, France, where they designed, implemented, and validated a setup for testing electronic cards for engine management in cars. In 2001, they completed a research internship at IEN Galileo Ferraris Research Institute (now part of INRIM) in Torino, Italy, where they conducted magnetic measurements. From 2002 to 2006, they were a PhD student at CEA-Léti Institute in Grenoble, France, where they researched carbon nanotubes and filaments films for electronic cold emission. From 2006 to 2009, they were a Research Scientist at CEA-Liten Institute in Grenoble, France, where they researched growth and integration of carbon nanotubes for nanoelectronic building blocks. From 2009 to 2011, they were a Research Engineer for IBM. Finally, from 2011 to 2015, they were a Characterization and Metrology Engineer for NEXCIS, where they were responsible for quality control of thin film PV modules along the manufacturing process.

Thomas Goislard de Monsabert received their DEUG in Physics from Université Côte d'Azur in 1997 to 1999. Thomas then attended Institut national des Sciences appliquées de Toulouse from 1999 to 2002 for Materials Physics. Lastly, they obtained their PhD in Materials Science and Engineering from Université Joseph Fourier, Grenoble (France) from 2002 to 2006.