Itzik Kaplan is an Optical Metrology Algorithm Scientist at Nova Measuring Instruments, with a focus on developing and demonstrating new metrology hardware and software tools since March 2021. Prior to this role, Itzik served as an Optical Metrology Application Scientist at Nova Measuring Instruments from August 2016 to March 2021, where responsibilities included improving modeling tools and developing metrology solutions for advanced optical applications. Earlier in the career, Itzik worked at Intel Corporation as a WE Process Engineer/Yield Engineer from August 2012 to August 2016, focusing on process control, quality improvement, and data analysis to enhance tool performance and yield. Itzik holds a Master’s degree in Theoretical and Mathematical Physics from The Hebrew University of Jerusalem, earned between 2005 and 2010.
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