Jennifer Wang is a seasoned reliability manager at nubia since April 2007, overseeing the reliability testing of a diverse range of products including wireless telephones, mobile phones, and various components. With extensive experience in reliability testing methods and standard optimization, Jennifer has successfully linked test sample sizes to reliability and confidence levels, and has contributed to the development of the FEMA model for design reviews. Jennifer also possesses a background as a junior process engineer at SAE ELECTRONIC CO., LTD, where issues related to solder corrosion were effectively addressed through advanced analytical techniques. Jennifer holds a Master's degree in Atomic and Molecular Physics from Sichuan University and a Bachelor's degree in Physics from Yantai Normal University.
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