Daniel Burggraf

Daniel Burggraf is currently the DFT and Test Methodology Manager at Onsemi, where they focus on design-for-test capabilities and product engineering innovation. With 21 years of experience in the VLSI semiconductor sector, they have a strong background in test and product engineering, specializing in NOR Flash memory development, ATE testing, and design-for-test methodologies. Previously, at Texas Instruments, they held roles such as IP Development & Validation Supervisor, where they validated and qualified high-density embedded NOR Flash IP, and Product and Test Engineering Supervisor, managing product testing and qualification processes. Daniel obtained a BS in Electrical Engineering with a minor in Mathematics from Texas A&M University, concentrating on semiconductors and electrodynamics.