Byung Chul Yoo

Byung Chul Yoo is an accomplished engineering professional with extensive experience in system-on-chip (SoC) verification and design. Currently serving as VP of Technology at Samsung Electronics since September 2018, Byung Chul Yoo has led controller verification for NVMe and UFS controllers across various markets. Prior to this role, Byung Chul Yoo worked at Intel Corporation for over 13 years as a Verification Architect, specializing in SoC verification methodologies. Previous positions at Silicon Image, Samsung Semiconductor, and Sandcraft provided a foundation in digital design, verification, and testing. Byung Chul Yoo holds a Master of Science in Electrical Engineering with a focus on VLSI design from the University of Southern California and a Master of Engineering in System and Control from Korea University.