Steffen Richter is a Metrology Engineer at SCHOTT since November 2023, with prior experience as a Researcher at Lund University from January 2022 to November 2023, specializing in THz and infrared ellipsometry. Background includes expertise in optical access to electronic properties and lattice vibrations in anisotropic semiconductors and two-dimensional electron gases for applications in high-power and high-frequency electronics, particularly focusing on wide-bandgap semiconductors. Previous roles as a Postdoctoral Researcher at Linköping University and ELI Beamlines Facility involved advanced THz ellipsometry and time-resolved spectroscopic ellipsometry, respectively. Richter's doctoral work at Leipzig University centered on optically anisotropic planar microcavities, contributing to the understanding of opto-electronic devices and topological photonics. Education includes a Master of Science and Bachelor of Science in Physics, both from Leipzig University.
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