See-Spital
Jeffrey Naarden has extensive experience in the medical imaging field, currently serving as an MTRA at See Spital AG since July 2012, where responsibilities include performing X-rays and CT scans during weekend shifts. Additionally, Jeffrey has held the role of Applications Specialist AX-XP at Siemens Healthcare since May 2009, providing system setup and user training, along with first-level support. Previous roles include serving as a speaker for a ‘Digital imaging’ course at Medi Bern and leading the X-Ray department at Hirslanden, managing a team and handling various administrative tasks. Jeffrey's career began as an X-ray technician at Alysis Zorggroep and includes earlier experience in sales at Fashion Acts BV. Educational achievements include a Bachelor's degree in MBRT from Fontys Hogeschool and additional studies in French at KV Business School Zürich.
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