Donal O'Farrell is an experienced professional with a strong background in materials analysis, process engineering, and data science. O'Farrell began a career as a Research Assistant at Tyndall National Institute, focusing on graphene properties, before transitioning to a Laboratory Technician role at Microanalysis Australia. At Intel Corporation, O'Farrell excelled as a Process Engineer, implementing process changes and utilizing advanced analytical techniques. Subsequently, O'Farrell held multiple leadership roles at Siemens, including heading the Data Driven and AI team and leading a team of data scientists to enhance smart building solutions. Academic credentials include a Bachelor's Degree in Physics and Chemistry of Advanced Materials from Trinity College, Dublin, a Master's Degree in Chemistry from The University of Glasgow, and a Data Analysis Nanodegree from Udacity.
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