Tom Evans is a Senior Quality Manager at Silfex, Inc., a division of Lam Research Corporation, with extensive experience in quality assurance within the semiconductor industry. They previously held roles as Quality/Plant Manager at Harris Thomas Industries and Quality Manager at Deerfield Manufacturing, where they specialized in quality processes for various manufacturing sectors. Tom's educational background includes an MBA from the University of Cincinnati and ongoing studies towards a Lean Six Sigma Black Belt at Moresteam University, along with a BA in Business Management from Wilmington College. They are skilled in Geometric Dimensioning & Tolerancing, Six Sigma, Industrial Engineering, and Root Cause Analysis.
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