Angelo Scardilla is a Reliability Manager at STMicroelectronics Italia, having transitioned to this role from Quality & Reliability Engineer in December 2020. They previously served as an RF Senior Product Engineer and led the NAND FLASH memory Characterization and Backend testing team at both STMicroelectronics and Micron Technology. Angelo possesses deep knowledge of flash memory characterization and validation methodologies, as well as strong skills in programming languages and AGILE project management. They hold a Master's Degree in Electronic Engineering from the Università di Catania.
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