Jonathan Young is a highly experienced engineering professional specializing in product and test engineering, currently serving as a Product and Test Engineering Manager at Texas Instruments since October 2021. Prior experience includes roles as a Test Solutions Engineering Manager at Micron Technology and Product Test Engineering Manager at IM Flash, where Jonathan managed teams to optimize testing for advanced non-volatile memory technologies and led initiatives for parallel testing methodologies. Previous roles encompass Product Engineer and Product Yield Enhancement Engineer at Micron Technology, with responsibilities in front-end product disposition and reliability monitoring. Jonathan's early career involved research assistant positions at the University of Illinois at Urbana-Champaign and Brigham Young University, focusing on semiconductor technologies and fiber optic sensors. Jonathan holds a Master of Science in Electrical Engineering from the University of Illinois Urbana-Champaign and a Bachelor of Science in Electrical Engineering from Brigham Young University.
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