David Tesh is an experienced professional in the semiconductor industry with a career spanning several notable companies. Currently serving as Characterization Manager at Triad Semiconductor since October 2013, David has held various engineering roles, including Staff Product Characterization Engineer at RFMD from February 2006 to October 2013, and Sr. Product Engineer at Texas Instruments from December 2003 to January 2006. Prior to these positions, David worked as Staff Product Engineer at Arques Technology and Semtech, and as Sr. Product Engineer at Analog Devices, contributing to a breadth of expertise in product characterization and engineering. David holds a degree from Guilford College, completed between 1996 and 2000.
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