XI LIU is a Reliability Engineer at TRUMPF North America since June 2015, with prior experience as a Research Assistant at Ohio University, where significant work included building parametric models for accelerated life testing and analyzing the reliability of electronic devices. In addition to earlier roles as a Reliability Engineer Intern at Solectria - A Yaskawa Company and an Instructor of Engineering Economy at Ohio University, XI LIU has held a visiting scholar position at Texas A&M University, focusing on accelerated life testing for new NVM devices and related research. Academic credentials include a Master of Science in Industrial Engineering from Ohio University and a Bachelor of Science in Traffic Engineering from Beijing Jiaotong University. Publications in reputable journals reflect contributions to the field.
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