Sandeep Goel

Sandeep Goel is a seasoned professional in the semiconductor industry, currently serving as TSMC Academician/Director since May 2010, specializing in the design and development of advanced test solutions for process test chips across cutting-edge nodes (5nm to 2nm) and various packaging technologies. Previous roles at TSMC include Deputy Director and Department Manager, where Sandeep focused on test, verification, and defect diagnosis challenges, contributing to automotive solutions and heterogeneous system integration. Prior experience includes positions as a Principal Engineer at LSI, a Member of Consulting Staff at Magma Design Automation, and a Senior Researcher at Philips Research, where Sandeep honed expertise in test cost reduction, defect screening, and digital VLSI testing methods. Sandeep holds a PhD in Electrical and Computer Engineering from the University of Twente, an M.Tech in VLSI Design Tools and Technology from the Indian Institute of Technology, Delhi, and a B.Tech in Electronics and Communication Engineering from the Institute of Engineering and Technology.