Jay Mucha is a Senior Research Associate at the University of Houston since January 2010, specializing in the application of thin-film spectroscopic methods to atomic-layer etching and deposition processes. Prior experience includes working as a Senior Scientist at INFICON, where the focus was on developing algorithms for real-time process monitoring and fault detection in various manufacturing processes. Mucha also served as a Member of Technical Staff at AT&T/Lucent Bell Laboratories, contributing to the copper interconnect program at SEMATECH and developing novel thin film materials. As a Project Manager at SEMATECH, responsibility included barrier-seed development and university contract administration for copper and barrier deposition. Mucha holds a PhD in Physical Chemistry from the University of Pittsburgh and a BA in Chemistry from Washington & Jefferson College.
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