Le Shen is a Principal Engineer in Reliability Engineering at Western Digital and has held various roles in technology and telecommunications sectors. They previously worked as a Staff Reliability/FA Testing Engineer at Western Digital, developing failure analysis methods and automation scripts. Le has also served as a NPSG Q&R Engineer at Intel and a Technical Program Manager at Supermicro. With early experience as a Network Test Engineer at China Telecom, Le managed testing for advanced telecommunications equipment and organized cross-discipline testing efforts. They hold a Master's degree in Business Intelligence & Analytics from Stevens Institute of Technology and are currently pursuing a Master's degree in Information and Telecom Engineering at Xidian University.
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