Li Tang is the Head Characterization Engineer at Western Digital, bringing extensive expertise in electric testing, data analysis, failure analysis, and magnetic materials characterization. Previously, Li served as a Senior Staff Engineer at Seagate Technology, where they focused on thin film sputter processes and magnetic recording physics. Li also held positions as an Advisory Engineer at Hitachi Global Storage Technologies and a Senior Sputtering Process Engineer at Hoya Corporation USA. Their academic background includes ongoing studies for a Bachelor of Science in Physics from Lanzhou University, a PhD in Materials Science from the University of California, Berkeley, and a Master of Engineering in Metal Physics from the University of Science and Technology Beijing.
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