Ko Hui Lee

Ko Hui Lee is a Senior Manager in the Asia FA and Field Quality Lead at 聯發科, where they focus on product qualification and reliability. With nine years of expertise in reliability and failure analysis, they have made significant contributions in dielectric reliability testing and electrical characterization. Previously, Ko Hui led advanced reliability testing development at 台積電, successfully qualified 7nm devices, and resolved critical product quality issues. They hold a Ph.D. in Electronic Engineering from National Chiao Tung University, where they also completed a Master's degree.