Maarten Voncken is an experienced manager in the semiconductor industry, currently serving as the Head of Research Metrology at ASML. Their extensive experience includes managing various teams and projects in Research and Development, focusing on optical and e-beam metrology techniques. Maarten has a strong background in overseeing high-skilled professionals and maintaining university partnerships for research funding, with previous roles including Department Manager and Group Manager at ASML. They earned a PhD from Radboud University Nijmegen, where their research centered on high-efficiency solar cells. Maarten also completed an internship at the Energy Research Foundation, contributing to advancements in solar cell technology.
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