Daniel Beckmeier is a seasoned reliability engineer with extensive experience in semiconductor technology. They served as a Principal Semiconductor Reliability Engineer at onsemi from 2019 to 2021, focusing on reliability characterization and process development. Currently, as a Staff Electrical Reliability Engineer at Astranis Space Technologies since 2025, Daniel develops models to predict component life and advises on design reliability. Their previous roles included positions at Intel Corporation and Cruise, where they contributed to advancing reliability methods and testing protocols. Daniel earned a PhD and has a strong background in technology reliability monitoring and semiconductor memory research from their time as a research associate at Bundeswehr University Munich.
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