Jim Conner

Jim Conner has extensive experience in the field of semiconductor and materials science. Jim began their career in 1981 as a Technical Staff Member at Aerojet Electronic Systems Division, where they designed, fabricated, and tested low-temperature infrared sensor arrays and silicon-based processing arrays for use on surveillance satellites. In 1988, Conner moved to Oak Ridge National Laboratory as a Laboratory Graduate Participant Fellow, where they characterized adsorbates and films using atomic-resolution electron microscopy, image simulation techniques, and surface science tools. Jim also conducted MBE growth of multiple-layer thin film structures. From 1992 to 1997, Conner worked as a Materials Scientist at Motorola, where they provided advanced imaging and analytical capabilities for cutting-edge semiconductor devices. In 2004, they took on a similar role at Freescale Semiconductor, Inc., where they held full responsibility for all day-to-day lab operations and supervised a team of 8. From 2008 to 2012, Conner worked as a Senior Engineer at Samsung Austin Semiconductor, where they conducted failure analysis of high-volume semiconductor memory products and interacted with internal customers to identify appropriate analytical methods. Since 2012, Conner has been a Senior Research Scientist at Cerium Laboratories, LLC.

Jim Conner began their education in 1976, when they attended the Massachusetts Institute of Technology and earned a Bachelor of Science in Physics. Jim then continued their studies at Cornell University, where they earned a Doctor of Philosophy in Materials Science in 1992.