Johan DEBAYLE is a highly experienced professional in the field of image processing and analysis, currently serving as a Senior Member of the Society of Photo-Optical Instrumentation Engineers (SPIE) and an Associate Editor for several prestigious journals. Since March 2018, Johan has been actively involved with SPIE, including roles as a Course Instructor and Visiting Lecturer. Additionally, Johan is the Editor-in-Chief for Pattern Analysis and Applications and holds various editorial positions at Springer Nature. At École des Mines de Saint-Étienne, Johan is a Full Professor, Vice-Head of the SPIN Center, and leads the M.Sc. in Mathematical Imaging and Spatial Pattern Analysis. Johan's involvement extends to the CNRS as Deputy Director of the LGF UMR 5307 Research Laboratory and Director of the MORPHEA Research Group. Recognized as a Fellow Member by multiple professional societies, Johan was also honored as a Knight in the French Order of Academic Palms in 2022. Academic qualifications include a PhD in Image Processing and Analysis and a Habilitation Degree in Mathematical Imaging.
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