Draper
Maurice Karpman is a distinguished microelectronics manufacturing professional with extensive experience in Reliability Engineering, Failure Analysis, and Yield Engineering, specifically focusing on MEMS, semiconductors, and advanced packaging. Currently serving as a Distinguished Member of Technical Staff at Draper since June 2008, Maurice previously held roles in Reliability Engineering and Failure Analysis at Analog Devices, Inc. from October 1997 to June 2008. Earlier engineering roles were completed at Polaroid between 1990 and 1995 and at Motorola from 1989 to 1990. Maurice holds a Master of Science degree in Materials Systems, with a focus on engineering and economics, from the Massachusetts Institute of Technology, completed in May 1987.
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