Yonghang Fu

Yonghang Fu is a seasoned engineer with extensive experience in systems engineering, algorithm development, and machine vision. Since November 2015, Yonghang has served as Principal Systems Engineer at MKS Instruments, focusing on enhancing the accuracy of MLCC test system wheel handler positioning. Prior roles include Sr. Algorithm Development Engineer at Nanometrics, where work centered on reconstructing 3D surfaces from white light interference data, and various positions at Rudolph Technologies, where contributions involved the development of 2D and 3D wafer inspection equipment. Additionally, Yonghang served as Senior Machine Vision Scientist at Innovative Solutions for Automation, leading the design of hardware and software for wafer inspection systems. Earlier in the career, significant research was conducted at Texas Tech University and IHEP, contributing to advancements in real-time systems for wafer defect inspections and managing pharmaceutical research teams. Yonghang holds a Bachelor's Degree in Geosciences from Nanjing University.