NADA Technologies, Inc.
Jeff Harris is an accomplished engineering professional with extensive experience in the semiconductor and green energy sectors. Currently a System Engineer and Senior Mechanical Engineer at NADA Technologies, Inc., Jeff has been instrumental in advancing semiconductor sorting and inspection technology since June 2012. In addition, Jeff serves as Vice President at ISDG, Inc., a full-service marketing and advertising agency, a role held since 1988. Previously, Jeff held several engineering positions, including Senior Mechanical Engineer at KLD Energy Technologies, Systems Design Engineer at HamaTech USA, and Manufacturing Engineer III at Applied Materials, where a strong focus on design for manufacturability was emphasized. Jeff's early career includes roles as Designer/Artist at Origin and Product Engineer at Ruska Instrument Corporation, demonstrating a diverse skill set in both engineering and creative design. Education includes a certificate in Mechanical Drafting/Technical Illustration from Capitol City Trade and Technical School.
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NADA Technologies, Inc.
Get the performance and quality you demand with NADA Technologies, Inc. (NADAtech) wafer automation equipment. Designed to work with virtually all substrates across all semiconductor markets, you can now achieve improved yield, advanced traceability, and a quicker ROI with innovative inspection and metrology enhancements. You can count on NADAtech to build specialized wafer sorter tools that no other competitor can provide. Delivering the state-of-the-art functionality that your organization requires to stay competitive, our sorters work with 50mm to 300mm wafer sizes and can handle all wafer types. Include our Sorter+ Options and you can achieve speeds ranging from 325WPH to 850WPH while also running inspection and metrology tests. Each system is highly configurable from the number of ports to application specific options, including high speed sorting, thin wafer, and precision inspection and metrology capabilities. Dual and triple functionality can be engineered into each system with NADAtech’s Sorter+ Inspection and Metrology Options. Find and measure defects on wafer surfaces and edges using a variety of applications specially designed to identify issues early in the production process. Sorter+ Options include bright light inspection, automated optical inspection, wafer thickness and much more. NADAtech has also developed innovative pre and post bond wafer inspection metrology and process equipment. These unique tools for bond room applications will increase your throughput while greatly reducing the rework loop. Solutions include inspections for macro defects, eutectic and fusion bonds; measurements for frit overlays, glass and bond seals; bonder alignment and metrology, and more. Delivering advanced technology with stellar customer service, you can count on NADAtech to provide innovative solutions to your demanding automation requirements. Simply put, we help you get the most out of your wafer sorting tools.