Seokhan Kim is an experienced application specialist and developer with a strong background in metrology and wafer inspection systems. Currently serving at Nearfield Instruments B.V. since December 2018, Seokhan is involved in the development of the Quadra AFM metrology system, focusing on fiducial development, wafer alignment, and user documentation. Previous roles include application engineering at KLA-Tencor and Applied Materials, where responsibilities encompassed recipe creation, optimization, and Matlab utility development to support wafer inspection and defect detection. Seokhan's career began at Fine Semitech Corp., conducting research on EUV laser systems and developing wafer inspection technologies. Educational qualifications include a Master's degree in Optics/Optical Sciences from Gwangju Institute of Science and Technology and a Bachelor's degree in Physics from Ajou University.
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Nearfield Instruments
Nearfield Instruments develops and markets High-Throughput Scanning Probe Metrology systems for semiconductor manufacturing