Sara Martin Horcajo

Sara Martin Horcajo is a seasoned professional in reliability engineering, with extensive experience in Gallium Nitride (GaN) technologies. Currently serving as a Senior GaN Reliability Manager at Nexperia since May 2020, Sara Martin Horcajo has designed comprehensive reliability test plans and established advanced testing capabilities. Previously, at Huawei Technologies, expertise included enhancing the reliability of III-V devices through failure analysis. Early roles involved postdoctoral research focused on thermal evaluation techniques at the Centre for Device Thermography and Reliability, teaching physics at the University of Bristol, and reliability studies at ISOM, specializing in GaN device performance. Academic credentials include a PhD and a Master's in electronic systems from Universidad Politécnica de Madrid, as well as degrees in Electronic Engineering and Technical Telecommunications from Universidad de Valladolid.