Jonas Harm is a Specialist Product Engineer at NXP Semiconductors, with experience in developing RF-packaging technologies and system-level demonstrators for Radar SoCs. Prior roles included Validation Engineer and Senior Validation Engineer, where responsibility encompassed test development, automation, and performance characterization over various conditions. Jonas completed a PhD in Physics at Universität Hamburg, focusing on the construction of a cryogenic ultra-high vacuum system for advanced microscopy techniques while also contributing to lab development in surface science and nanophysics. Earlier experience as a Student Assistant involved automating measurements using LabVIEW.
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