Scott Lan is a staff engineer at 安森美半导体, specializing in test development and operation with 24 years of hands-on experience. Scott has held various engineering and management roles at companies including Freescale Semiconductor, NXP Semiconductors Austria, and the ASE Group, where they led teams in wafer probe test engineering and new test technology introduction. Scott holds a Bachelor’s degree in Electronic Engineering from National Cheng-Kung University and a Master’s degree in Computer Science and Electronic Engineering from National Taiwan University of Science and Technology. Fluent in Mandarin and English, Scott is also a trained Six Sigma green belt and has certification as a GMA and VDA 6.3 auditor.
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