Ali Abuelmaatti is a Senior Staff RF Engineer and Characterization & Test Automation Manager with extensive experience in RF test and characterization spanning various positions in leading semiconductor companies. Ali developed LabVIEW test automation for RF evaluation and characterization at firms such as NXP Semiconductors and Peregrine Semiconductor. They hold a Ph.D. in RF Electronics from the University of Glasgow and have a solid foundation in analogue and digital electronics from their B.Sc. at The University of Salford, as well as an M.Sc. in ASIC Electronics VLSI from the Institute for System Level Integration.
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