Patrick Gagnon

Patrick Gagnon has over 20 years of experience in the semiconductor industry. Patrick began their career in 1996 as a Field Service Engineer for Silicon Valley Group Lithography Div., where they performed installations and acceptance testing on new DUV scanners for Intel, Motorola, IBM, AMD, and Texas Instruments. In 1999, they joined Texas Instruments as a Photolithography/Metrology Equipment Engineer, where they monitored tool performance data to ensure stable tool performance to baseline processes, installed and maintained lithography tools ranging from 193nm & 248nm scanners to 365nm steppers, implemented improvement programs to enable the exposure tools to meet manufacturing requirements, and led an engineering team implementing a factory-wide RFID automated product tracking system. In 2008, they became a Partner/President/CEO at Semicon Photometrology Solutions, LLC., where they focused on laser refurbishment for 30 and 75mw 488nm Argon lasers used in the wafer inspection metrology tools, as well as tool cleaning wafers and reticles.

Patrick Gagnon attended McGill University from 1974 to 1978.