Jeff Gelb

Jeff Gelb is an experienced professional in the field of X-ray microscopy, currently serving as the Director and previously holding roles as Product Manager and Applications Manager at Sigray, Inc. since September 2017. In this role, Gelb manages system demonstrations, oversees product development for the X-ray microscopy line, and creates user-friendly interfaces. Prior experience includes significant contributions as a Senior Applications Engineer at Carl Zeiss X-ray Microscopy, where Gelb led a multi-year project for the Li-ion battery market and drove correlative microscopy application development. Earlier career roles as a Web Developer and Lab Assistant highlight Gelb's diverse skill set, complemented by a Bachelor of Science in Physics from UC Santa Barbara and a Master of Science in Materials Engineering from San José State University.