Daniele P. is a Senior Staff Test Engineer at STMicroelectronics, specializing in the semiconductor industry with a focus on mixed-signal devices and post-silicon validation. They previously held positions as a Senior Test Engineer at NXP Semiconductors and a Senior Test Development Engineer at ams OSRAM, where they developed ATE test programs and collaborated with design teams to enhance testability. Daniele earned a Master’s Degree in Electrical and Electronics Engineering from the Università degli Studi di Firenze, along with a Bachelor's Degree from the same institution. They also completed an Erasmus Exchange Program at Tampere University of Technology.
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