Sai Vamsidhar Chinta

Sai Vamsidhar Chinta is a seasoned engineer specializing in radio frequency (RF) testing with significant experience in the semiconductor and wireless industries. Currently serving as a Principal Radio Frequency Test Engineer at NXP Semiconductors since May 2021, Sai Vamsidhar has previously held the position of Sr Radio Frequency Test Engineer at Tarana Wireless, Inc., where responsibilities included developing manufacturing test specifications and validation board schematics. Prior roles include Principal RF Test/Product Engineer at NXP Semiconductors, Sr. Product Test Engineer at Motorola Mobility, and various research and co-op positions, focusing on RF engineering and optical systems. Educational qualifications include a Master's degree in Electrical & Telecommunications Engineering from Drexel University and a Bachelor’s degree in Electronics and Communications Engineering from VIT University. Proficient in designing RF components and automating testing procedures, Sai Vamsidhar combines technical expertise with a strong foundation in engineering principles.