Amy Romero is a Power Die Applications Engineer at Wolfspeed, where since March 2018, design and development of new test systems for the characterization of SiC MOSFETs has been a primary focus. Prior experience includes a role as a Research Assistant at the Center for Power Electronics Systems, where static and dynamic characterization of wide-bandgap devices was conducted alongside power module design and PCB modifications for GaN transistors. An internship at General Motors involved evaluation and analysis of models for gate driver designs, while experience as a Reliability Engineer Intern at VT iDirect encompassed design margin tests and RF signal measurements. Amy Romero holds a Master's degree in Electrical Engineering (Power Electronics) and a Bachelor of Science in Electrical Engineering, both from Virginia Tech.
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