Yudong Hao is the Director of Algorithms at Applied Materials, where they have been leading efforts since 2020. With around 30 years of professional experience in optical metrology and instrumentation, they possess over 20 years of expertise in the semiconductor industry, particularly in metrology and process control solutions. Yudong has held various positions at Nanometrics, including Sr. Applications Scientist and Director of Apps Characterization, where they contributed significantly to product development and strategic account management. They are recognized as an industry expert in Optical Critical Dimension (OCD) metrology and have authored software for data analysis while mentoring numerous engineers and scientists in the field.
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