Gianluca Rengo

Gianluca Rengo is a PhD fellow in Strategic Basic Research at Research Foundation Flanders - FWO since November 2019 and a PhD Researcher at imec since May 2019, focusing on the project titled "Mechanisms of in situ p-type doping in epitaxial Si1-xGex for source/drain layers." Rengo has developed expertise in the development and characterization of epitaxy processes using RP-CVD, specifically for p-type doped silicon germanium. Prior experience includes a Master's thesis at imec from May 2018 to October 2018, where Rengo gained skills in semiconductor films characterization and metal/semiconductor contacts characterization, as well as developing an Excel VBA routine for automatic post-processing of IV-curve measurements. Rengo holds a Master's degree in Nanotechnology Engineering from Sapienza Università di Roma (2015 - 2018) and a Bachelor's degree in Aerospace Engineering from the same institution (2011 - 2015).