Ying Shi is a highly experienced research scientist with a strong background in analytical techniques, particularly X-ray diffraction. Currently serving as a research scientist at Materials Discovery Research Institute since January 2024, Ying has also held the position of senior research scientist at Corning Incorporated since December 2011. Prior roles include serving as an X-ray analysis specialist at Dow Chemical from June 2007 to December 2011 and as an analytical scientist at Delphi from May 2001 to June 2007. Ying Shi earned a Doctor of Philosophy (Ph.D.) in solid state physics from the Institute of Physics at the Chinese Academy of Science between 1994 and 1997.
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