Chun-Min Zhang

Chun-Min Z. currently serves as an Industrial Post-Doctoral researcher at CSEM, focusing on the development of CMOS image sensors utilizing novel sensing materials for various imaging applications. Prior experience includes working as an Analog/Mixed-Signal IC Designer at Fastree3D, where efforts were centered on SPAD-based LiDARs for direct time-of-flight applications. Previous roles entail significant research collaborations at EPFL, where Chun-Min Z. contributed to modeling 28-nm bulk MOSFETs, resulting in numerous publications, as well as work as a Visiting Scientist at CERN performing irradiation measurements. Early research at Fudan University involved developing innovative semi-floating-gate transistors and exploring thin-film growth related to microelectronics. Chun-Min Z. holds a PhD in Microsystems and Microelectronics from EPFL, along with a Master's and Bachelor's degree in Microelectronics from Fudan University and Jiangnan University, respectively.