Dave McAlpine

Dave McAlpine is an experienced Senior Parametric Test Engineer with a career spanning over three decades in the semiconductor industry. Currently at Diodes Incorporated since April 2019, Dave has also held senior engineering roles at Texas Instruments from November 2010 to March 2019 and National Semiconductor from July 1983 to November 2010, where contributions included positions in process development and yield engineering. Academic credentials include a Bachelor of Science in Computing from the University of Paisley and an HNC in Electrical and Electronic Engineering from James Watt College.