Dr. Stewart is the founder of DualAlign™ LLC and a professor in the Department of Computer Science at Rensselaer Polytechnic Institute in Troy, New York. Dr. Stewart earned his PhD at the University of Wisconsin in the Computer Sciences Department and his bachelor's degree in Mathematics at Williams College. He has published over 50 papers in the fields of computer vision and medical image analysis and been awarded four patents. In 1999, together with a student and a colleague, his paper was chosen from over 500 national and international submissions to win the Best Paper Award at the IEEE Conf. on Computer Vision and Pattern Recognition.
Dr. Stewart has graduated 11 PhD students, many of whom have gone on to academic and industrial leadership positions. Dr. Stewart has also led the development of a number of computer vision software projects, including an industrial inspection system, a retinal image analysis system, and the Dual-Bootstrap algorithm.
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