Arnon David

Arnon David is an experienced engineering professional with a strong background in product and test engineering, particularly in the semiconductor industry. Currently serving as Reliability Test Manager at Innoviz Technologies since May 2020, Arnon has successfully managed reliability tests for various components and sub-assemblies. Previous roles include Silicon Operations Reliability Manager and Senior Product & Test Engineer at Innoviz Technologies, as well as staff positions at Qualcomm, Intel Corporation, and Apple. Arnon has also contributed as a part-time Patent Agent and as a Semiconductor Product & Test Engineering Consultant. Educational qualifications include a BSc in Computer & Electrical Engineering from the Technion - Israel Institute of Technology.