Chris White

Chris has over 35 years experience in the semiconductor industry. He started his career at Texas Instruments as a Failure Analyst, and failure analysis has bee his passion ever since. Chris’s broad range of experience in the semiconductor industry has provided expertise in all areas of Failure Analysis. His experience ranges from I/C Designer, Product Engineer, Process Integration Engineer, Yield Engineer, Reliability Engineer, and QA Engineer. Chris has been a key contributor in new product introduction for designs using new technology for Vitesse and Cypress. Chris has worked with many of the design and process technologies in his career. Some of his experiences in the design and process technologies are dynamic and static RAM, EPROM, Microprocessors, Linear products, Metal Gate, CMOS, VMOS, Bipolar (including schottky design), CMOS (including radiation harden technology), Silicon On Insulator (SOI), and GaAs technology.