Julian Duff has a diverse background in the field of RF testing and research, with experience as an RF Test Engineer at Northrop Grumman and as an RF Test Technician at Boeing. Additionally, Julian has served as an IQ Camera Technician at Vicon Industries, a Student Researcher at Farmingdale State College, and a Research Assistant at the College of Nanoscale Science and Engineering. This combination of roles highlights a strong foundation in both practical applications and academic research within the technology sector.
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